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Alling B, Karimi A, Hultman L, Abrikosov I. First-principles study of the effect of nitrogen vacancies on the decomposition pattern in cubic Ti1−xAlxN1−y. Applied physics letters : a publication of the American Institute of Physics 2008;92 p.071903-1-071903-3.

Frodelius J. Characterization of Ti2AlC Coatings deposited with high velocity oxy-fuel and magnetron sputtering techniques. Linköping: LiU-Tryck; 2008.

Ghafoor N. Material science of multilayer x-ray mirrors. Linköping: LiU-Tryck; 2008.

Höglund C. Reactive magnetron sputter deposition and characterization of thin films from the Ti-Al-N and Sc-Al-N systems. Linköping: LiU-Tryck; 2008.

Lewin E, Persson P, Lattemann M, Stüber M, Gorgoi M, Sandell A, Ziebert C et al. On the origin of a third spectral component of C1s XPS-spectra for nc-TiC/a-C nanocomposite thin films. Surface and Coatings Technology 2008;202 p.3563-3570.

Persson P, Rosén J, McKenzie D, Bilek M, Höglund C. A solid phase reaction between TiCx thin films and Al2O3 substrates. Journal of applied physics 2008;103 p.0661021-0661023.

Pozina G, Hemmingsson C, Forsberg U, Lundskog A, Kakanakova-Gueorguie A, Ivanov I, Monemar B et al. Time-resolved photoluminescence properties of AlGaN/AlN/GaN high electron mobility transistor structures grown on 4? SiC substrate. 8th International Conference on Physics of Light-Matter Coupling in Nanostructures; 2008 Tokyo, Japan. 2008.

Trinh D, Ottosson M, Collin M, Reineck I, Hultman L, Högberg H. Nanocomposite Al2O3-ZrO2 thin films grown by reactive dual radio-frequency magnetron sputtering. Thin solid films : an international journal on the science and technology of thin and thick films 2008;516 p.4977-4982.

Trinh D. Nanocrystalline alumina-zirconia thin films grown by magnetron sputtering. Linköping: LiU-Tryck; 2008.

Wilhelmsson O, Eklund P, Högberg H, Hultman L, Jansson U. Structural, electrical and mechanical characterization of magnetron-sputtered V-Ge-C thin films. Acta materialia. 2008; p.1-7.

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Last updated: 05/05/08