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Lecture

  

Description

  

Lecturer                     

1

 

Introduction + Light Optical Microscopy (LOM)

 

Fredrik Eriksson

2

 

X-ray Diffraction (XRD) and X-ray Reflectivity and Diffuse Scattering (XRR)

 

Fredrik Eriksson

3

 

Scanning Electron Microscopy (SEM) and Energy Dispersive X-ray Analysis (EDX)

 

Hans Högberg

4

 

Auger Electron Spectroscopy (AES) and X-ray Photoelectron Spectroscopy (XPS), incl. notes on report writing

 

Fredrik Eriksson

5

 

Transmission Electron Microscopy (TEM)

 

Naureen Ghafoor

6

 

Secondary Ion Mass Spectrometry (ToF-SIMS)

 

Jens Jensen

7

 

Electron Diffraction (ED)

 

Naureen Ghafoor

8

 

Ellipsometry

 

Roger Magnusson


Responsible for this page: Fredrik Eriksson
Last updated: 01/10/17