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Ellipsometry is an old technique with nice properties. By monitoring the effect a surface (with or without an organic film) has on elliptically polarized light, one can obtain optical properties of the surface. Thicknesses of films on the surface can be deduced by optical modeling. We have in our facilities two types of ellipsometers; ordinary null-ellipsometers and one imaging null-ellipsometer. We mainly use these ellipsometers for thickness-evaluations of different organic films. Our imaging ellipsometer (EP3 from Nanofilm Surface Analysis) is used for evaluating protein-array chips, an example is shown in figure 1.

Figure 1 An example of a simple protein array chip. a)A gold surface was patterned with two different alkanethiols, biotin was coupled to carboxyle groups in the squares and streptavidin was washed over the surface. The image is taken with imaging ellipsometry and a clear contrast can be seen. b) The data in the image is transformed into a thickness map of the surface. c) A line profile taken from the thickness-map; the squares are approximately 3 nm higher than the frames.
Null ellipsometer
Imaging ellipsometer

(The null ellipsometers are located in room N204, and the imaging ellipsometer is located in room N213)


Null ellipsometers: Caroline Brommesson (Caroline.Brommesson@liu.se)

Imaging ellipsometer: Thomas Ederth (ted@ifm.liu.se)

Responsible for this page: Erik Martinsson
Last updated: 06/11/15