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Applied Optics Research Competence

A main competence area is optics of surfaces and thin films and development of appropriate methodology for such investigations. Our experience has accumulated during more than 15 years of using and developing ellipsometry in various forms, including:

  • Spectroscopy (1.24 - 5 eV) - Dielectric functions of bulk and thin film samples. Analysis of multilayered samples.
  • In-situ kinetic studies - Protein adsorption at solid/liquid interfaces. Gas absorption in porous layers and polymer layers
Another competence area is data acquisition and signal processing in complex systems.

Responsible for this page: Anna Maria Uhlin
Last updated: 07/26/07