Per Persson
Associate Professor/Lecturer |
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I am the senior electron microscopy researcher at the department of Physics, Chemistry and Biology, with a particular interest in aberration corrected instruments as well as monochromated sources for high resolution ELNES.
As of 2009, I am appointed by the Swedish Research Council as a senior researcher in “Electron microscopy imaging and chemical analysis with atomic resolution in structural chemistry and Nanoscience ”. I intend to use this opportunity to enable nanostructural investigations by a combination of calculations/ spectroscopy.
This award was very timely considering the large donation of 50 MSek by Knut and Alice Wallenberg for the acquisition of an aberration corrected (S )TEM among other equipment. Recently, we made the decision to buy a double corrected Titan(XFEG, Monochromator , and Quantum ERS GIF). This instrument will be installed in a new house, designed for the purpose, in January 2011.
This image comes from a 4H SiC crystal in the 11-20 projection, and the repetition period of the zig-zag sequence after four layers is about 1 nm. Measured resolution in this image is better than 0.8 Å, one can even see the difference in contrast between the brighter Si atoms and the slightly darker (and smaller) C atoms. Multiple scattering effects are also seen. |
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This HRSTEM image shows the natural lamination of TiC slabs separated by Si layers. The material is the highly interesting MAX phase Ti3SiC2 which is both metallic and ceramic in its properties. |
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